Dynamic Characterization of Optically Controlled Semiconductor Devices
| Berceli, Tibor | ||
| Cabon, Béatrice | ||
| Hilt, Attila | ||
| Járó, Gábor | ||
| Ladvánszky, János | ||
| 2021-10-29T08:02:56Z | ||
| 2021-10-29T08:02:56Z | ||
| 1996-03-25 | ||
AbstractOptical control of semiconductor devices is a new area, which can be used in several applications. The dynamic behavior of these devices is a crucial problem. Reliable method for its characterization is highly needed. The paper presents characterization methods with their measurement procedures. The measurement setup consists of both optical and microwave instrumentation. The device under test is illuminated by a laser beam intensity modulated by a microwave signal. The modulation represents the perturbation. The device properties are measured without modulation and with varying modulation frequency. | hu_HU | |
| http://hdl.handle.net/10890/15808 | ||
| en | hu_HU | |
| Dynamic Characterization of Optically Controlled Semiconductor Devices | hu_HU | |
| Könyvrészlet | hu_HU | |
| Open access | hu_HU | |
| Hilt Attila | hu_HU | |
| 1996 March 25 | hu_HU | |
| Budapest, Hungary | hu_HU | |
| COST 240 Workshop | hu_HU | |
| 1996-03-25 | ||
| BME, Budapest University of Technology and Economics | hu_HU | |
| Proc. of the COST 240 Workshop | hu_HU | |
| Post print | hu_HU | |
| Villamosmérnöki és Informatikai Kar | hu_HU | |
| 3103811 | ||
| Műszaki tudományok | hu_HU | |
| Műszaki tudományok - villamosmérnöki tudományok | hu_HU | |
| Villamosmérnöki tudományok | hu_HU | |
| optical control | hu_HU | |
| semiconductor device | hu_HU | |
| dynamic characterization | hu_HU | |
| Tudományos közlemények, publikációk – Tudományterület, Tudományág (ld. fent) | hu_HU | |
| Igen | hu_HU | |
| Konferenciacikk | hu_HU | |
| Budapesti Műszaki és Gazdaságtudományi Egyetem | hu_HU |