Dynamic Characterization of Optically Controlled Semiconductor Devices
Date
Type
Könyvrészlet
Language
en
Reading access rights:
Open access
Rights Holder
Hilt Attila
Conference Date
1996 March 25
Conference Place
Budapest, Hungary
Conference Title
COST 240 Workshop
Container Title
Proc. of the COST 240 Workshop
Version
Post print
Faculty
Villamosmérnöki és Informatikai Kar
Subject Area
Műszaki tudományok
Subject Field
Villamosmérnöki tudományok
Subject (OSZKAR)
optical control
semiconductor device
dynamic characterization
semiconductor device
dynamic characterization
Gender
Konferenciacikk
University
Budapesti Műszaki és Gazdaságtudományi Egyetem
- Cite this item
- http://hdl.handle.net/10890/15808
OOC works
Abstract
Optical control of semiconductor devices is a new area, which can be used in several applications. The dynamic behavior of these devices is a crucial problem. Reliable method for its characterization is highly needed. The paper presents characterization methods with their measurement procedures. The measurement setup consists of both optical and microwave instrumentation. The device under test is illuminated by a laser beam intensity modulated by a microwave signal. The modulation represents the perturbation. The device properties are measured without modulation and with varying modulation frequency.