Characterization method for thermal interface materials imitating an in-situ environment

Contributor - Author	Vass-Várnai, András
Contributor - Author	Sárkány, Zoltán
Contributor - Author	Kerecsen Istvánné Rencz, Márta
Date - Accessioned	2016-09-04T21:34:59Z
Date - Available	2016-09-04T21:34:59Z
Date - Issued	2012
Identifier - URI	http://hdl.handle.net/10890/4502
Language - ISO	en
Title	Characterization method for thermal interface materials imitating an in-situ environment
Type	folyóiratcikk
Container Identifier ISSN	0026-2692
Container Identifier ISSN	0959-8324
Container Periodical Number	9
Container Periodical Volume	43
Container Title	MICROELECTRONICS JOURNAL
Identifier - MTMT	2675955
Identifier - Scopus	84864778913
Identifier - Web of Science	000307692500010
Type Type	szakcikk

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