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Thermal characterization of multi-die packages

Poppe, András
Y Zhang
Farkas, Gábor
H Won
J Wilson
Szabó, Péter
2016-09-04T21:29:38Z
2016-09-04T21:29:38Z
2006
http://hdl.handle.net/10890/2549
en
IEEE Press
Thermal characterization of multi-die packages
könyvrészlet
1-4244-0664-1
Proceedings of the 8th Electronics Packaging Technology Conference (EPTC'06)
2613647
50249110221
000245279600084
2613644
konferenciaközlemény

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