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Electrical characterization of tungsten nanowires deposited by focused ion beam (FIB)
Electrical characterization of tungsten nanowires deposited by focused ion beam (FIB)
Date
2006
Title
Electrical characterization of tungsten nanowires deposited by focused ion beam (FIB)
Authors
Horváth E
Neumann, Péter Lajos
Tóth AL
Vázsonyi É
Biró LP
Fürjes P
Dücső C
Type
egyéb
Gender
nem besorolt
Cite this item
http://hdl.handle.net/10890/2862
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