Using fault tolerant design patterns to assure data veracity
Date
Authors
Type
könyvfejezet
Language
en
Reading access rights:
Open Access
Rights Holder
Budapest University of Technology and Economics, Department of Measurement and Information Systems
Conference Date
2024.02.05-2024.02.06.
Conference Place
Budapest, Hungary
Conference Title
31th Minisymposium of the Department of Measurement and Information Systems
ISBN, e-ISBN
978-963-421-951-4
Container Title
Proceedings of the 31th Minisymposium
Department
Department of Measurement and Information Systems
Version
Kiadói változat
Faculty
Faculty of Electrical Engineering and Informatics
First Page
84
Subject (OSZKAR)
Data quality
data veracity
CPS
IOT Data
ISO/IEC 25012
fault tolerance
data processing
data veracity
CPS
IOT Data
ISO/IEC 25012
fault tolerance
data processing
Gender
Konferenciacikk
University
Budapest University of Technology and Economics
- Cite this item
- https://doi.org/10.3311/MINISY2024-016
OOC works
Abstract
Data forms the vital asset of many organizations, as the quality of their decisions depends on the quality of their data. Trust in data is, therefore, critical. This paper aims to evaluate different aspects of data quality, examine the existing data veracity characteristics, and propose a methodology to assess the impact of fault-tolerant design patterns on data veracity. Data generated by IoT devices often reveals characteristics such as noise, incompleteness, and imprecision [1], which make it a prime example for data quality assessment. This paper investigates how we can effectively address the attributes and characteristics associated with data veracity by applying fault-tolerant design patterns within the data processing workflow.