Robust ADC Testing With Very Long Time Records

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URI
http://hdl.handle.net/10890/4560
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Title
Robust ADC Testing With Very Long Time Records
Author
Dabóczi, Tamás
Date of issue
2012
Publisher
IEEE
Language
en
Identifiers
MTMT: 2680542
Scopus: 84864220139
Web of Science: 000309449100505
Title of the container document
Proceedings of the 2012 IEEE International Instrumentation and Measurement Technology Conference
ISBN, e-ISBN
978-1-4577-1771-0; 978-1-4577-1772-7
Document type
könyvrészlet
Document genre
konferenciaközlemény