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New Way for Thermal Transient Testing

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URI
http://hdl.handle.net/10890/2537
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  • BME PA dokumentumai [3731]
Title
New Way for Thermal Transient Testing
Author
Székely, Vladimir
Kerecsen Istvánné Rencz, Márta
Poppe, András
B Courtois
Date of issue
1998
Publisher
IEEE
Language
en
Identifiers
MTMT: 2613582
Scopus: 0032640876
Web of Science: 000079934500024
Title of the container document
Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
ISBN, e-ISBN
0780344863
Document type
könyvrészlet
Document genre
konferenciaközlemény

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