New Way for Thermal Transient Testing

Title: New Way for Thermal Transient Testing
Author: Székely, Vladimir; Kerecsen Istvánné Rencz, Márta; Poppe, András; B Courtois
Date of issue: 1998
Publisher: IEEE
Language: en
Identifiers: MTMT: 2613582; Scopus: 0032640876; Web of Science: 000079934500024
Title of the container document: Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
ISBN, e-ISBN: 0780344863
Document type: könyvrészlet
Document genre: konferenciaközlemény