New Way for Thermal Transient Testing

View/ Open
Metadata
Show full item recordCollections
- BME PA dokumentumai [3731]
- Title
- New Way for Thermal Transient Testing
- Author
- Székely, Vladimir
- Kerecsen Istvánné Rencz, Márta
- Poppe, András
- B Courtois
- Date of issue
- 1998
- Publisher
- IEEE
- Language
- en
- Identifiers
- MTMT: 2613582
- Scopus: 0032640876
- Web of Science: 000079934500024
- Title of the container document
- Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
- ISBN, e-ISBN
- 0780344863
- Document type
- könyvrészlet
- Document genre
- konferenciaközlemény