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Issues in junction-to-case thermal characterization of power packages with large surface area

Vass-Várnai, András; Shan Gao; Sárkány, Zoltán; Jongman Kim; Seogmoon Choi; Farkas, Gábor; Poppe, András; Kerecsen Istvánné Rencz, Márta (IEEE Press, 2010)

Characterization method for thermal interface materials imitating an in-situ environment

Vass-Várnai, András; Sárkány, Zoltán; Kerecsen Istvánné Rencz, Márta (2012)

Measurement Based Compact Thermal Model Creation - Accurate Approach to Neglect Inaccurate TIM Conductivity Data

Vass-Várnai, András; Robin Bornoff; Sárkány, Zoltán; Ress, Sándor László; Kerecsen Istvánné Rencz, Márta (IEEE Press, 2011)

Application of Thermal Transient Testing for Solar Cell Characterization

Vass-Várnai, András; Plesz, Balázs; Sárkány, Zoltán; A Malek; Kerecsen Istvánné Rencz, Márta (IEEE, 2012)

Comparison of JEDEC Dynamic and Static Test Methods for Thermal Characterization of Power LEDs

Vass-Várnai, András; John Parry; Gergely Toth; Ress, Sándor László; Farkas, Gábor; Poppe, András; Kerecsen Istvánné Rencz, Márta (2012)